The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2014
Filed:
Aug. 19, 2011
Applicant:
Xiaoguang Wang, Alpharetta, GA (US);
Inventor:
Xiaoguang Wang, Alpharetta, GA (US);
Assignee:
Cognex Corporation, Natick, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
Abstract
Described are computer-based methods and apparatuses, including computer program products, for identifying defects in a material. A set of features is identified based on an image of a material, wherein each feature in the set of features is a candidate portion of a defect in the material. A set of chained features is selected based on the set of features, wherein each chained feature comprises one or more features that represent candidate portions of a same defect in the material. A defect in the material is identified based on the set of chained features and the image.