The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2014
Filed:
May. 10, 2011
Applicants:
William M. Heruska, Sicklerville, NJ (US);
Michael Uscinowicz, Hainesport, NJ (US);
Gregory A. Arlow, Southampton, NJ (US);
Fred Tanjutco, Cherry Hill, NJ (US);
Inventors:
William M. Heruska, Sicklerville, NJ (US);
Michael Uscinowicz, Hainesport, NJ (US);
Gregory A. Arlow, Southampton, NJ (US);
Fred Tanjutco, Cherry Hill, NJ (US);
Assignee:
Lockheed Martin Corporation, Bethesda, MD (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 3/46 (2006.01); H04L 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An open architecture design for a digital nearfield test system for nearfield testing of a phased array antenna allows the ability to use the components of an individual phased array antenna to be tested in conjunction with a nearfield scanner probe system allowing an efficient and cost-saving 'radar testing the radar' scenario.