The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2014

Filed:

Mar. 26, 2010
Applicant:

Guy Kennedy, Underhill, VT (US);

Inventor:

Guy Kennedy, Underhill, VT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/16 (2006.01);
U.S. Cl.
CPC ...
G02B 21/16 (2013.01);
Abstract

An apparatus for a low numerical aperture exclusion imaging apparatus is provided. The apparatus may include an electromagnetic illumination source for illuminating a portion of a specimen; and for collecting an image created by the electromagnetic radiation an objective lens optically coupled to the electromagnetic illuminated portion of the specimen. The apparatus also includes an optical blocking plate disposed between the objective lens and a focusing lens. The optical blocking plate is positioned to substantially block undesired electromagnetic radiation from image sources distally aligned in the same optical axis as the specimen. This invention enhances narrow depth of field characteristics in imaging and also enhances discreet imaging in a narrow focus field by eliminating some or most of the light which contributes to wide depth of field focus which is useful for optical sectioning ranging from microscopy to photography. Optical sectioning provides the information necessary for 3D image reconstructions and other X Axis spatial measurements.


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