The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2014

Filed:

Oct. 26, 2012
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Tado Hayashide, Utsunomiya, JP;

Takeyoshi Saiga, Utsunomiya, JP;

Ikutaro Mitsutake, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01); H04N 1/04 (2006.01); H04N 1/10 (2006.01);
U.S. Cl.
CPC ...
G02B 26/0816 (2013.01); H04N 1/1043 (2013.01); H04N 1/1052 (2013.01);
Abstract

An image reading optical system, including: an imaging optical system used for imaging a slit area of a document and includes an optical element having different cross section shapes in a main scanning direction and in a sub-scanning direction; an aperture stop; and an optical phase changing filter disposed adjacent to the aperture stop and including a phase lead area and a phase delay area, in which the optical phase changing filter includes a surface shape component that is symmetric only with respect to a predetermined plane including a surface normal at the center of the incident beam and one of the main scanning direction and the sub-scanning direction, and with respect to a surface that includes the surface normal at the center of the incident beam and is perpendicular to the predetermined plane, one side is the phase lead area, and another side is the phase delay area.


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