The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2014
Filed:
Jul. 11, 2011
Mitsuru Kitamura, Tokyo, JP;
Hidekazu Okuno, Tokyo, JP;
Masato Taninaka, Tokyo, JP;
Dai Nippon Printing Co., Ltd, Tokyo, JP;
Abstract
Two original images to be recorded are prepared as data (S). A plurality of unit regions, each having an adequate area to record interference fringes of visible light, are defined and positioned on a hologram recording surface (S). A gradation pattern, with which appearance probabilities of two record attributes gradually change in space, is overlapped onto the recording surface, and to each unit region, one of either record attributes is assigned according to the appearance probabilities of the respective record attributes at each individual position (S). In each unit region, to which the first record attribute is assigned, the first original image is recorded as an interference fringe pattern, a diffraction grating pattern, or a scattering structure pattern, and in each unit region, to which the second record attribute is assigned, the second original image is recorded as an interference fringe pattern, a diffraction grating pattern, or a scattering structure pattern (S), and a record pattern is formed on a physical medium (S).