The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2014
Filed:
Sep. 28, 2007
R Victor Klassen, Webster, NY (US);
R Victor Klassen, Webster, NY (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
Systems and methods are described that facilitate reducing metamerism in a scanner or printer system by evaluating and manipulating unfiltered clear channel information. Using a four channel model to predict CIE XYZ tristimulus values from RGB and clear, a linear model is generated based on a polynomial matrix conversion. For example, one such model has coefficients weighting 1, R, G, B, W, R, G, B, W, RG, RB, RW, GB, GW, BW, and corresponding third order terms. The XYZ values predicted by the linear model are converted to L*a*b*, and compared with measured L*a*b* values. A statistic involving the difference between measured and computed L*a*b* values is used as a metric in a non-linear optimization to obtain the best values for the matrix elements. Once the matrix is optimized, it is employed for printer calibration, error detection, and the like.