The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2014

Filed:

Aug. 28, 2012
Applicants:

Francois Perraut, Saint Joseph de Riviere, FR;

Henri Grateau, Le Gua, FR;

Inventors:

Francois Perraut, Saint Joseph de Riviere, FR;

Henri Grateau, Le Gua, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2014.01);
U.S. Cl.
CPC ...
Abstract

A device for optical measurement of materials includes a zone opposite a dot including a material, a light source emitting light along an axis in the direction of the zone, where the material interacts with the light it receives, and a light guide to convey a proportion of the light emitted by the dot under the effect of the illumination. The guide includes a light scatterer associated with the source and causing a proportion of the light emitted by the dot to penetrate into the guide, such that it is guided in a direction perpendicular to the axis; the scatterer is annular in shape, and thus delimits a zone of the light guide, and the area of the zone is greater than or equal to the area of the cross-section of the portion of light beam incident to the material.


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