The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2014
Filed:
May. 31, 2011
Jürgen Kaufmann, Denzlingen, DE;
Frank Nuber, Emmendingen, DE;
Michael Overdick, Emmendingen, DE;
Rolf Schiffler, Kenzingen, DE;
Jürgen Kaufmann, Denzlingen, DE;
Frank Nuber, Emmendingen, DE;
Michael Overdick, Emmendingen, DE;
Rolf Schiffler, Kenzingen, DE;
Sick AG, Waldkirch, DE;
Abstract
The invention relates to an improved optoelectronic apparatus for optical gas analysis by means of which the interfering influence of the particles contained in the gas is reduced with regard to the intended measurement. For this purpose the optoelectronic apparatus in accordance with the invention has a light transmitter and a light receiver which define an optical measurement path including a measurement volume between one another. The received signals of the light receiver can be evaluated in an evaluation unit, to ultimately obtain the desired information therefrom, for example, the concentration of a specific gas content. In accordance with the invention an ionizer is further provided which is arranged upstream of the optical measurement path. The ionizer causes an ionization of the undesirable particles, i.e. e.g. the dust particles, smoke particles or such like aerosols so that the ionized particles can be deflected by electric fields or also magnetic fields by means of an ion acceleration apparatus. In this respect the ion acceleration apparatus and/or its electromagnetic fields is/are aligned such that the generated ions experience a deflection to be able to flow past the measurement volume.