The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2014

Filed:

Mar. 10, 2011
Applicants:

Junpei Shiraishi, Kanagawa-ken, JP;

Masashi Hakamata, Kanagawa-ken, JP;

Inventors:

Junpei Shiraishi, Kanagawa-ken, JP;

Masashi Hakamata, Kanagawa-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Excitation light beam is irradiated onto a test region while shifting the irradiation position thereof, when performing analysis of a target substance using an analysis chip having the test region within a flow channel through which a sample solution is caused to flow, for capturing the target substance within the sample solution. Fluorescence generated at the test region is detected as a plurality of adjustment fluorescence signals. The target substance is analyzed using fluorescence generated when the excitation light beam is irradiated at an irradiation position within the test region determined based on the plurality of adjustment fluorescence signals.


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