The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2014
Filed:
Sep. 26, 2011
Stewart P. Wood, Midland, MI (US);
Charles F. Broomall, Midland, MI (US);
Stewart P. Wood, Midland, MI (US);
Charles F. Broomall, Midland, MI (US);
Dow Global Technologies LLC, Midland, MI (US);
Abstract
A system for analyzing the pore size of a substrate or device containing substrates adapted to separate fluids and has at least two surfaces, a first and a second surface, which are isolated from, one another and wherein the substrate or devices containing the substrates have an exit for fluids passing through the substrate, comprising: a) a particle generator () capable of generating particles of a controlled size; b) a system () for creating a pressure differential between the first and the second surface of the substrate; c) a light source () spaced front the exit of the substrate or device containing the substrate adapted for illuminating particles exiting the exit of the substrate or device containing the substrate; d) a closed flow path from the particle generator to the first surface of the substrate; e) a substrate or device holder () adapted for holding the substrate or device in the proper location in the system; and f) one or more reference images. Also described are methods of utilizing the system to identify pore sizes of substrates.