The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2014

Filed:

Jul. 18, 2011
Applicants:

Seongchong Park, Daejeon, KR;

Dong Hoon Lee, Daejeon, KR;

Seung Nam Park, Daejeon, KR;

Inventors:

Seongchong Park, Daejeon, KR;

Dong Hoon Lee, Daejeon, KR;

Seung Nam Park, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/04 (2006.01); G01J 1/42 (2006.01); G01J 3/02 (2006.01);
U.S. Cl.
CPC ...
G01J 1/04 (2013.01); G01J 1/42 (2013.01); G01J 3/0251 (2013.01); G01J 3/0254 (2013.01);
Abstract

Provided are an integrating sphere photometer and a measuring method of the same. The integrating sphere photometer includes a plurality of photodetectors, an integrating sphere having through-holes formed to correspond to the photodetectors, baffles disposed inside the integrating sphere in front of the photodetectors to be spaced apart from the photodetectors, a photometer disposed at a through-hole, and an adjustment unit adjusting output signals of the photodetectors to have the same output signal with respect to light illuminated from a point-like standard light source disposed at a center region in the integrating sphere.


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