The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2014

Filed:

Jul. 02, 2010
Applicants:

Giacinto Busico, Northampton, GB;

Neil David Whitbread, Northampton, GB;

Andrew John Ward, Northampton, GB;

Andrew Moseley, Northamptonshire, GB;

Inventors:

Giacinto Busico, Northampton, GB;

Neil David Whitbread, Northampton, GB;

Andrew John Ward, Northampton, GB;

Andrew Moseley, Northamptonshire, GB;

Assignee:

Oclaro Technology Limited, Northamptonshire, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/42 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical wavelength monitor photodiode integrated on a wafer and/or an optical device and coupled to optical components thereof provides wavelength measurement. The optical wavelength monitor includes a photodiode configured to output a signal that is representative of a wavelength of the light. An additional photodiode may be included in the optical wavelength monitor, each photodiode differing from the other in operating characteristics. The monitor may be used in testing the optical device while in wafer form and when the optical device has been cleaved from the wafer at the bar level. Testing/monitoring of the optical device may also be performed during use, for example, to control the wavelength of a laser such as a tunable laser.


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