The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2014

Filed:

Apr. 01, 2010
Applicants:

Brian Cabral, San Jose, CA (US);

HU He, Santa Clara, CA (US);

Elena Ing, Santa Clara, CA (US);

Sohei Takemoto, Fremont, CA (US);

Inventors:

Brian Cabral, San Jose, CA (US);

Hu He, Santa Clara, CA (US);

Elena Ing, Santa Clara, CA (US);

Sohei Takemoto, Fremont, CA (US);

Assignee:

Nvidia Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 9/68 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for correcting image data. Embodiments of the present invention provide calibration and image correction to overcome various lens effects including lens shading and lens imperfections. In one embodiment, the correction of image data is performed via utilization of a spline surface (e.g., Bezier surface). The use of spline surfaces facilitates efficient hardware implementation. The image correction may be performed on a per channel and illumination type basis. In another embodiment, the present invention provides a method for determine a spline surface to be used for calibrating an image signal processor to be used in correcting image data.


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