The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2014

Filed:

Jul. 12, 2011
Applicant:

Kevin L. Brown, Clermont, FL (US);

Inventor:

Kevin L. Brown, Clermont, FL (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/33 (2006.01); F21V 9/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A multi-band aperture filter for optically coupling to a focal plane array (FPA) of a camera includes a substrate, and a first spectral coating on a first surface of the substrate that passes both a first longer and a second shorter wavelength band. A second spectral coating that passes the longer wavelength band and blocks the shorter wavelength band is on an outer annulus region, but not on an inner region on the first surface or a second surface of the substrate. The second spectral coating provides a larger aperture area for the longer wavelength band as compared to an aperture area for the shorter wavelength band to passively realize different F-numbers for the bands to provide substantially matched beam spot sizes on the detector array for the longer wavelength band and the shorter wavelength band, such as a long-wave infrared (LWIR) band and a mid-wave IR (MWIR) band.


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