The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2014
Filed:
Sep. 09, 2008
Andreas Heinrich Dietzel, Kempen, DE;
Harmannus Franciscus Maria Schoo, Eersel, NL;
Marinus Marc Koetse, Eindhoven, NL;
Andreas Heinrich Dietzel, Kempen, DE;
Harmannus Franciscus Maria Schoo, Eersel, NL;
Marinus Marc Koetse, Eindhoven, NL;
Abstract
An optical sensor for measuring a force distribution includes a substrate, one or more light emitting sources, and one or more detectors provided on the substrate, with the detectors responsive to the light emitted by the sources. A deformable opto-mechanical layer is also provided on the substrate with light responsive properties depending on a deformation of the opto-mechanical layer. The design of the sensor and particularly the use of optical components in a deformable layer make it possible to measure the contact force accurately, including in some embodiments, the direction of the contact force. The sensor is scalable and adaptable to complex shapes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile