The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2014
Filed:
Aug. 29, 2011
Zhiyong Tan, Shanghai, CN;
Juncheng Cao, Shanghai, CN;
Yingjun Han, Shanghai, CN;
Zhen Chen, Shanghai, CN;
Zhiyong Tan, Shanghai, CN;
Juncheng Cao, Shanghai, CN;
Yingjun Han, Shanghai, CN;
Zhen Chen, Shanghai, CN;
Abstract
The present invention provides a power measurement apparatus and method for a pulsed terahertz quantum-cascade laser (THz QCL). The apparatus includes a light source part, a light path part, and a detection part. Terahertz light emitted by a THz QCL reaches a terahertz quantum-well photodetector (THz QWP) through the measurement apparatus, and is absorbed to generate a corresponding current signal. A signal processing circuit extracts a voltage signal from the current signal, amplifies the voltage signal, and inputs the amplified voltage signal to an oscilloscope for reading and displaying. According to a responsivity of the THz QWP at a lasing frequency of the laser, the measurement of the output power of the pulsed THz QCL is acquired. The present invention avoids integration estimation when a thermal detector is used to measure output power of a THz QCL in a pulse operating mode, and can directly acquire the power value of a pulsed output from the laser according to the amplitude of the detector responding to the pulsed terahertz light.