The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2014
Filed:
Nov. 16, 2011
Dante Nakazawa, West Haven, CT (US);
James Zickefoose, Coventry, CT (US);
Lloyd Cass, Toronto, CA;
Gregory Bogorodzki, Richmond Hill, CA;
Dominique Rothan, Aigremont, FR;
Timothy Spillane, Quincy, MA (US);
Dante Nakazawa, West Haven, CT (US);
James Zickefoose, Coventry, CT (US);
Lloyd Cass, Toronto, CA;
Gregory Bogorodzki, Richmond Hill, CA;
Dominique Rothan, Aigremont, FR;
Timothy Spillane, Quincy, MA (US);
Canberra Industries, Inc., Meriden, CT (US);
Abstract
A system and method for correcting, based on a monitored subject's height and thickness, the net count rate value of a whole-body surface contamination monitoring device. The device includes a height detection means for determining the height of a subject being monitored, and a thickness detection means for determining the thickness of at least a portion of the body of the subject being monitored. The net count rate is based on site calibration factor data and self-shielding factor data, wherein both types of factor data consider the determined height and thickness.