The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2014

Filed:

May. 05, 2010
Applicants:

Ted-hong Shinn, Hsinchu, TW;

Henry Wang, Hsinchu, TW;

Fang-an Shu, Hsinchu, TW;

Yao-chou Tsai, Hsinchu, TW;

Inventors:

Ted-Hong Shinn, Hsinchu, TW;

Henry Wang, Hsinchu, TW;

Fang-An Shu, Hsinchu, TW;

Yao-Chou Tsai, Hsinchu, TW;

Assignee:

E Ink Holdings Inc., Hsinchu County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 29/786 (2006.01); H01L 29/10 (2006.01); H01L 21/34 (2006.01);
U.S. Cl.
CPC ...
H01L 29/78693 (2013.01); H01L 29/1083 (2013.01); H01L 29/78609 (2013.01); H01L 21/34 (2013.01);
Abstract

A method for manufacturing oxide thin film transistors includes steps of: forming a gate, a drain electrode, a source electrode, and an oxide semiconductor layer respectively. The oxide semiconductor layer is formed on the gate electrode; the drain electrode and the source electrode are formed at two opposite sides of the oxide semiconductor layer. The method further includes a step of depositing a dielectric layer of silicon oxide, and a reacting gas for depositing the silicon oxide includes silane and nitrous oxide. A flow rate of nitrous oxide is in a range from 10 to 200 standard cubic centimeters per minute (SCCM). Oxide thin film transistors manufactured by above method has advantages of low leakage, high mobility, and other integrated circuit member can be directly formed on the thin film transistor array substrate of a display device.


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