The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2014
Filed:
Dec. 15, 2009
Applicants:
Jones Hyman, Wake Forest, NC (US);
John Walsh, Wake Forest, NC (US);
Thurman Thorpe, Durham, NC (US);
Inventors:
Jones Hyman, Wake Forest, NC (US);
John Walsh, Wake Forest, NC (US);
Thurman Thorpe, Durham, NC (US);
Assignee:
bio Mérieux, Inc., Durham, NC (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q 1/04 (2006.01);
U.S. Cl.
CPC ...
C12Q 1/04 (2013.01);
Abstract
The present invention relates to methods and systems for scanning, detecting, and monitoring microorganisms on solid or semi-solid media using intrinsic fluorescence (IF) measurements. The methods are further directed to detection, characterization and/or identification of microorganisms on a solid or semi-solid media using intrinsic fluorescence (IF) measurements that are characteristic of said microorganisms.