The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2014

Filed:

Jul. 01, 2011
Applicants:

Masatoshi Sakurai, Tokyo, JP;

Yousuke Isowaki, Yokohama, JP;

Soichi Oikawa, Hachioji, JP;

Inventors:

Masatoshi Sakurai, Tokyo, JP;

Yousuke Isowaki, Yokohama, JP;

Soichi Oikawa, Hachioji, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/66 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to one embodiment, a bit patterned medium includes a substrate, and a magnetic recording layer disposed above the substrate and including patterns of protrusions. Each of the protrusions contains a plurality of crystal grains. An average distance between the crystal grains is 0.5 to 3.0 nm in each of the protrusions. The protrusions include first protrusions each having a length of 1 μm or more in a radial direction of the medium and second protrusions each having a length in the radial direction shorter than the length of the first protrusion in the radial direction. Each of the first protrusions has a nucleation field Hn for magnetization reversal and a coercive force Hc satisfying the inequalities, Hn≧1.5 kOe and 0.5 kOe≦Hc−Hn≦1.5 kOe.


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