The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2014
Filed:
Jan. 19, 2012
Guangming Dai, Fremont, CA (US);
Charles E. Campbell, Berkeley, CA (US);
LI Chen, San Jose, CA (US);
Huawei Zhao, Irvine, CA (US);
Dimitri Chernyak, Sunnyvale, CA (US);
Guangming Dai, Fremont, CA (US);
Charles E. Campbell, Berkeley, CA (US);
Li Chen, San Jose, CA (US);
Huawei Zhao, Irvine, CA (US);
Dimitri Chernyak, Sunnyvale, CA (US);
AMO Manufacturing USA, LLC, Santa Ana, CA (US);
Abstract
The present invention provides methods, systems and software for scaling optical aberration measurements of optical systems. In one embodiment, the present invention provides a method of reconstructing optical tissues of an eye. The method comprises transmitting an image through the optical tissues of the eye. Aberration data from the transmitted image is measured across the optical tissues of the eye at a first plane. A conversion algorithm is applied to the data, converting it to corrective optical power data that can be used as a basis for constructing a treatment for the eye at a second plane.