The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2014

Filed:

Apr. 16, 2012
Applicants:

Ken Kawashima, Tokyo, JP;

Takashi Yanagisawa, Yokohama, JP;

Inventors:

Ken Kawashima, Tokyo, JP;

Takashi Yanagisawa, Yokohama, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for processing test results from testing operation of software. A test result of pass, fail status, or unperformed is received for each test case of a test performed for each release of the software. A group to which each test belongs is ascertained. A test result stability index is calculated for each test case as being proportional to a total number of consecutive releases that include and are prior to the last release of the software such that the test result for each of the consecutive releases denotes a pass. A module stability index is calculated for each test case as being a summation over a product of a weight at each release and a binary stability indicator of 0 at each release for which the test result is changed from that of the immediately prior release and 1 at every other release.


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