The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2014
Filed:
Apr. 17, 2009
Shaohua Yang, Santa Clara, CA (US);
Weijun Tan, Longmont, CO (US);
Yuan Xing Lee, San Jose, CA (US);
Shaohua Yang, Santa Clara, CA (US);
Weijun Tan, Longmont, CO (US);
Yuan Xing Lee, San Jose, CA (US);
LSI Corporation, San Jose, CA (US);
Abstract
Various embodiments of the present invention provide systems and methods for deriving data from a defective media region. As an example, a method for deriving data from a defective media region is disclosed that includes providing a storage medium and performing a media defect detection that indicates a defective region on the storage medium. A first data decode is performed on data corresponding to the defective region. The first data decode yields a first output. It is determined that the first output failed to converge and based at least in part on the failure of the first output to converge, a second data decode is performed on the data corresponding to the defective region. The second data decode includes zeroing out any soft data corresponding to the defective region and providing a second output.