The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8745349 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 03, 2014

Filed:

Jul. 12, 2011
Applicants:

Douglas L. Lehr, Austin, TX (US);

Franklin E. Mccune, Tucson, AZ (US);

David C. Reed, Tucson, AZ (US);

Max D. Smith, Tucson, AZ (US);

Inventors:

Douglas L. Lehr, Austin, TX (US);

Franklin E. McCune, Tucson, AZ (US);

David C. Reed, Tucson, AZ (US);

Max D. Smith, Tucson, AZ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 11/14 (2006.01);
U.S. Cl.
CPC ...
G06F 12/00 (2013.01); G06F 11/1458 (2013.01);
Abstract

A detection module selects logically adjacent first and second control areas of a cluster. The detection module further determines that the first and second control areas satisfy a migration test wherein the first control area has free space exceeding a free threshold, the free space is at least equal to a space requirement for each second control area control interval, and the second control area has fewer control intervals than a control interval threshold. In addition, a copy module copies each second control area control interval to the first control area in response to determining that the first and second control areas satisfy the migration test.


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