The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2014
Filed:
Nov. 16, 2011
Rajendra Inamdar, N. Chelmsford, MA (US);
Anthony G. Vlatas, Brookline, NH (US);
Sandeep Shrivastava, Westford, MA (US);
Michael Cico, Hampton, NH (US);
Akbar Ali Ansari, Hopkinton, MA (US);
Rajendra Inamdar, N. Chelmsford, MA (US);
Anthony G. Vlatas, Brookline, NH (US);
Sandeep Shrivastava, Westford, MA (US);
Michael Cico, Hampton, NH (US);
Akbar Ali Ansari, Hopkinton, MA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
Described herein are systems and methods for collecting and surfacing metrics with respect to their classification; and the use of the metrics by a workload manager and other application monitoring tools to provide quality-of-service and workload management. Each request is classified, either by the application server or another process. A request classification identifier (RCID) is associated with each request, and thereafter flows with that request as it is being processed. The RCID value is used by data collectors at various points in the system to aggregate the metrics, and a workload manager collects the metrics. The collected metrics are then processed by a rules engine at the workload manager, which analyzes the metrics and generates adjustment recommendations to provide quality-of-service and workload management.