The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2014

Filed:

Aug. 13, 2012
Applicants:

Geoffrey Zenger, New Westminister, CA;

Philipp Ziegler, Vancouver, CA;

Inventors:

Geoffrey Zenger, New Westminister, CA;

Philipp Ziegler, Vancouver, CA;

Assignee:

Visier Solutions, Inc., Vancouver, BC, unknown;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments of apparatus, systems and methods facilitate performing on-demand cluster analysis on a multi-dimensional data set comprising a plurality of dimension members. In some embodiments, the method comprises: selecting a subset of the plurality of dimension members based on a current context associated with the multi dimensional data set; computing a plurality of dimensional scores for a plurality of dimension members in the selected subset, wherein each dimensional score is associated with a distinct dimension member and measures the dimensional influence of the associated dimension member on a metric associated with the multi-dimensional data set; and ranking the plurality of dimension members in the selected subset based on the dimensional score.


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