The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2014

Filed:

Dec. 23, 2008
Applicants:

Ying Chen, San Jose, CA (US);

Bin He, San Jose, CA (US);

Rui Wang, Beijing, CN;

Inventors:

Ying Chen, San Jose, CA (US);

Bin He, San Jose, CA (US);

Rui Wang, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30563 (2013.01);
Abstract

A method and system are disclosed for use with an ETL (Extract, Transform, Load) process, comprising optimizing a filter expression to select a subset of data and evaluating the filter expression on the data after the extracting, before the loading, but not during the transforming of the ETL process. The method and system optimizes the filtering using a pipelined evaluation for single predicate filtering and an adaptive optimization for multiple predicate filtering. The adaptive optimization includes an initial phase and a dynamic phase.


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