The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2014

Filed:

Sep. 21, 2010
Applicants:

Ian Francis Tindall, Bournemouth, GB;

James Hugh Vincent, Milton Keynes, GB;

Linda Phillips Crumpler, Clemmons, NC (US);

Inventors:

Ian Francis Tindall, Bournemouth, GB;

James Hugh Vincent, Milton Keynes, GB;

Linda Phillips Crumpler, Clemmons, NC (US);

Assignee:

Molins PLC, Milton Keynes, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
Abstract

A measurement apparatus is disclosed in which a barrier separates a chamber into a first region and a second region. The barrier is of a known thickness, and it comprises holes having a known radius. Gas flow means provide a flow of a carbon dioxide in the first region and a flow of a nitrogen in the second region. A gas detector measures the concentration of carbon dioxide in the second region and a processor calculates the theoretical diffusive flux from one region to another based on the known properties of the through-holes. The processor is arranged to calculate a calibration parameter in order to relate the measured parameter to the theoretical diffusive flux, based on the known properties of the through-holes.


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