The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2014
Filed:
Apr. 17, 2012
Jason Chang, Cambridge, MA (US);
John William Fisher, Iii, Brookline, MA (US);
Jason Chang, Cambridge, MA (US);
John William Fisher, III, Brookline, MA (US);
Massachusetts Institute of Technology, Cambridge, MA (US);
Abstract
In an approach for sampling a distribution of segmentations of an image, the segmentations are based on a level set function. For each sample of the distribution, the sampling includes the following, for each of multiple iterations: randomly selecting a set of locations of the level set function, determining a domain of allowed perturbations of the level set function at the selected set of locations, and randomly accepting a perturbation of the level set function according to a criterion corresponding to a biased distribution over the domain of allowed perturbations of the level set function, wherein the bias is selected to increase a probability of accepting the perturbation. The sampling also includes determining the sample of the distribution of segmentations according to a perturbed level set function determined in a final iteration of the multiple iterations for the sample.