The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2014

Filed:

Aug. 24, 2010
Applicant:

Maolin Chen, Beijing, CN;

Inventor:

Maolin Chen, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/0067 (2013.01); G06T 7/0012 (2013.01);
Abstract

Provided is a target analysis apparatus, method and computer-readable medium based on a depth image and an intensity image of a target is provided. The target analysis apparatus may include a body detection unit to detect a body of the target from the intensity image of the target, a foreground segmentation unit to calculate an intensity threshold value in accordance with intensity values from the detected body, to transform the intensity image into a binary image using the intensity threshold value, and to mask the depth image of the target using the binary image as a mask to thereby obtain a masked depth image, and an active portion detection unit to detect an active portion of the body of the target from the masked depth image.


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