The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2014

Filed:

Mar. 12, 2010
Applicants:

Rui Ishiyama, Tokyo, JP;

Hidekata Hontani, Nagoya, JP;

Fumihiko Sakaue, Nagoya, JP;

Inventors:

Rui Ishiyama, Tokyo, JP;

Hidekata Hontani, Nagoya, JP;

Fumihiko Sakaue, Nagoya, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

A feature point generation system capable of generating a feature point that satisfies a preferred condition from a three-dimensional shape model is provided. Image group generation meansgenerates a plurality of images obtained by varying conditions with respect to the three-dimensional shape model. Evaluation meanscalculates a first evaluation value that decreases steadily as a feature point group is distributed more uniformly on the three-dimensional shape model and a second evaluation value that decreases steadily as extraction of a feature point in an image corresponding to a feature point on the three-dimensional shape model becomes easier, and calculates an evaluation value relating to a designated feature point group as a weighted sum of the respective evaluation values. Feature point arrangement meansarranges the feature point group on the three-dimensional shape model so that the evaluation value calculated by the evaluation meansis minimized.


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