The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2014

Filed:

Jan. 21, 2010
Applicants:

Yoshiaki Sugaya, Tokyo, JP;

Taiga Goto, Tokyo, JP;

Koichi Hirokawa, Tokyo, JP;

Inventors:

Yoshiaki Sugaya, Tokyo, JP;

Taiga Goto, Tokyo, JP;

Koichi Hirokawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
Abstract

An X-ray CT apparatus includes: an X-ray source which emits X-rays while rotating around a subject; a compensation filter which adjusts at least one of the output distribution and the spectral distribution of the X-rays emitted from the X-ray source to the subject; an X-ray detector which is disposed opposite to the X-ray source with the subject interposed therebetween, rotates together with the X-ray source, and detects the amount of X-rays transmitted through the compensation filter and the subject; an image operation unit which reconstructs a tomographic image of the subject on the basis of the detected amount of X-rays; a display unit which displays the tomographic image; a control unit which controls each of the constituent components; and a compensation unit which compensates for deterioration of image quality, which is based on the amount of displacement between the rotation center of the X-ray source and a desired position of the subject, by changing an X-ray tube current modulation pattern indicating a time-series change of emission of the X-rays and/or by moving the position of the subject.


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