The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2014

Filed:

Jan. 12, 2012
Applicants:

Kentaro Osawa, Kokubunji, JP;

Hideharu Mikami, Kawasaki, JP;

Inventors:

Kentaro Osawa, Kokubunji, JP;

Hideharu Mikami, Kawasaki, JP;

Assignee:

Oclaro Japan, Inc., Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G02F 2/00 (2006.01); H04B 10/08 (2006.01); H04B 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A delay interferometer includes a half beam splitter and two pentagonal prisms disposed on a substrate. The half beam splitter branches light to be measured which travels substantially in parallel with the substrate into two branched light beams. The pentagonal prisms respectively reflect the respective branched light beams such that the optical axes of the branched light beams are moved in parallel in a direction substantially perpendicular to the substrate by reflection. The half beam splitter combines the branched light beams reflected by the pentagonal prisms to generate interference light beams.


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