The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2014
Filed:
May. 21, 2008
Boaz Ran, Haifa, IL;
Tal Rosenzweig, Kfar-Vradim, IL;
Ariel G. Notcovich, Haifa, IL;
Ariel Shemesh, Haifa, IL;
Yochanan Uri, Givat Elah, IL;
Michael Kanevsky, Tirat HaCarmel, IL;
James W. Hillendahl, Vacaville, CA (US);
Barak Abraham Liraz, Haifa, IL;
Boaz Ran, Haifa, IL;
Tal Rosenzweig, Kfar-Vradim, IL;
Ariel G. Notcovich, Haifa, IL;
Ariel Shemesh, Haifa, IL;
Yochanan Uri, Givat Elah, IL;
Michael Kanevsky, Tirat HaCarmel, IL;
James W. Hillendahl, Vacaville, CA (US);
Barak Abraham Liraz, Haifa, IL;
Bio-Rad Laboratories Inc., Hercules, CA (US);
Abstract
An SPR or other optical resonance based analysis system in which, light is provided at multiple angles to a specimen and then the light modified by the specimen is processed to select only some of the light. Optionally, the processing selects light at a particular incidence angle. Optionally, the detection is by imaging of the light on a 2D imager array.