The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2014
Filed:
Apr. 30, 2012
Kazuhiro Gono, Sagamihara, JP;
Kazuhiro Gono, Sagamihara, JP;
Olympus Medical Systems Corp., Tokyo, JP;
Abstract
An optical measurement apparatus, to which a base end portion of a measurement probe introduced into a subject is connected so that scattering light from the subject through the measurement probe can be measured, includes: calibration member serving as an irradiation target of illumination light when a calibration process is performed for the measurement probe using the illumination light from the measurement probe; an insertion portion where a leading end of the measurement probe can be inserted; a housing portion that communicates with the insertion portion and accommodates the calibration member movably along a penetration direction of the insertion portion; a detection unit that detects insertion of the measurement probe when the calibration member reaches a predetermined position in the housing portion by the insertion of the measurement probe through the insertion portion; and a control unit that performs control for initiating the calibration process when the detection unit detects the insertion of the measurement probe.