The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2014
Filed:
Apr. 08, 2013
Marvell International Ltd., Hamilton, BM;
Neric Fong, Santa Clara, CA (US);
Sang Won Son, Palo Alto, CA (US);
Marvell International Ltd., Hamilton, BM;
Abstract
Circuits, architectures, a system and methods for providing on-chip gain calibration. The circuit generally includes a receiver comprising (i) a resistor on a semiconductor substrate, the resistor configured to provide a signal having a noise component that varies with temperature, and (ii) an amplifier circuit on the semiconductor substrate coupled to the resistor, the amplifier circuit configured to receive the signal and provide a second signal having an amplitude greater than the first signal. The architectures and/or systems generally include those that embody one or more of the inventive concepts disclosed herein. The method generally includes (i) providing a noise signal from a resistor to an amplifier, the resistor being on a common semiconductor substrate with the amplifier, (ii) determining a resistance value of the resistor, (iii) determining an impedance at an input of the amplifier, and (iv) determining a gain of the amplifier.