The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2014
Filed:
Jul. 27, 2011
Xu Ouyang, Hopewell Junction, NY (US);
Tso-hui Ting, Stormville, NY (US);
Ping-chuan Wang, Hopewell Junction, NY (US);
Yongchun Xin, Pouhgkeepsie, NY (US);
Xu Ouyang, Hopewell Junction, NY (US);
Tso-Hui Ting, Stormville, NY (US);
Ping-Chuan Wang, Hopewell Junction, NY (US);
Yongchun Xin, Pouhgkeepsie, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An on-chip technique for noncontact electrical testing of a test structure on a chip is provided. On-chip photodiodes receives pump light from a pump light source, where the on-chip photodiodes are electrically connected to the test structure and are configured to generate power for the test structure. An on-chip coupling unit receives probe light from a probe light source, where the on-chip coupling unit is optically connected to on-chip waveguides through which the probe light is transferred. On-chip switches open in response to receiving voltage output from the test structure, and the on-chip switches remain closed when the voltage output is not received from the test structure. The on-chip switches pass the probe light when opened by the voltage output from the test structure. The on-chip switches block the probe light by remaining closed, when the voltage output is not received from the test structure.