The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2014

Filed:

Jun. 09, 2009
Applicants:

Binrong Wu, Tokyo, JP;

Hiroyuki Itagaki, Tokyo, JP;

Takashi Nishihara, Tokyo, JP;

Inventors:

Binrong Wu, Tokyo, JP;

Hiroyuki Itagaki, Tokyo, JP;

Takashi Nishihara, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

An object is to enhance usability of parameter check when an imaging parameter is changed in multistation imaging, and easily obtain a desired image with high quality. In the multistation imaging, it is determined in a lump before imaging whether an image having desired quality is obtained by using the changed value of the imaging parameter, and the result is presented to an operator. The determination is executed in the order of 'possible or impossible' determination of execution of imaging itself and 'possible or impossible' determination of combination of obtained images. When it is determined that it is impossible to execute the imaging itself, the determination processing is finished. At this time, a recommended value may be presented.


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