The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2014

Filed:

May. 18, 2009
Applicants:

Erik Martinus Hubertus Petrus Van Dijk, Eindhoven, NL;

Cornelius Antonius Hezemans, Neunen, NL;

Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/86 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical system for detecting light from a 2D area of a sample () comprises a collection lens () for collecting light from a collection region of the sample. A light detector () is positionally fixed with respect to the sample, and a reflector arrangement () directs collected light to the detector. The reflector arrangement comprises movable components and the collection lens () is movable relative to the sample. The collection lens and the movable components are configurable to define different collection regions, and the movement of the components effects a direction of the light from the collection region to a substantially unchanged area of the light detector (). This arrangement avoids the need for a bulky detector in order to detect signals from a 2D sample area formed by scanning across the sample.


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