The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2014
Filed:
Dec. 02, 2008
Hisato Fukuda, Kyoto, JP;
Hisato Fukuda, Kyoto, JP;
Shimadzu Corporation, Kyoto-Shi, JP;
Abstract
When a system is powered on and becomes ready for a measurement, it automatically begins to acquire an interferogram (IFG). When a new IFG is acquired, if a background (BKG) IFG is present in a memory but there is no sample IFG (Sand S), the new IFG is compared with the BKG-IFG and, if the two IFGs are identical, the new IFG is added to the BKG-IFG (S, Sand S). When an operator sets a sample in a sample chamber and the new IFG shows a change, the IFG is stored as a sample IFG (S). Then, a sample measurement is initiated. After that, when a new IFG is found to be identical to the sample IFG stored in the memory (Sand S), the new IFG is added to the sample IFG (S). The sample measurement is completed when the number of sample IFGs stored in the memory has reached a predetermined accumulation number. Thus, the sample measurement is automatically performed, for which the operator only needs to set a sample. The workload on the operator is reduced and the measurement task can be efficiently performed.