The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2014

Filed:

Mar. 04, 2009
Applicants:

Wan Y. Shih, Bryn Mawr, PA (US);

Wei-heng Shih, Bryn Mawr, PA (US);

Qing Zhu, San Jose, CA (US);

Inventors:

Wan Y. Shih, Bryn Mawr, PA (US);

Wei-Heng Shih, Bryn Mawr, PA (US);

Qing Zhu, San Jose, CA (US);

Assignee:

Drexel University, Philadelphia, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/551 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for enhancing the detection sensitivity of a piezoelectric microcantilever sensor. The method may involve providing a piezoelectric microcantilever and inducing a change in the Young's modulus during detection of a species of interest. The change in the Young's modulus may be induced or enhanced by the application of a DC bias electric field to the piezoelectric layer that enhances non-180° polarization domain switching of the piezoelectric layer. The change in the Young's modulus may also result from binding of the species of interest to the piezoelectric microcantilever sensor or a combination of binding and application of a DC bias electric field Significantly enhanced detection sensitivity results from the changed Young's modulus of the piezoelectric layer.


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