The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2014

Filed:

Dec. 15, 2009
Applicants:

Yuichi Hamada, Kobe, JP;

Keisuke Kuwano, Kobe, JP;

Inventors:

Yuichi Hamada, Kobe, JP;

Keisuke Kuwano, Kobe, JP;

Assignee:

Sysmex Corporation, Kobe, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 31/00 (2006.01); G01N 33/00 (2006.01); G01N 35/02 (2006.01); G01N 21/75 (2006.01); G01N 31/22 (2006.01); G01N 33/52 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A sample processing system comprising: a transporting apparatus for transporting a sample; a plurality of sample processing apparatuses, arranged along a direction in which the sample is transported by the transporting apparatus, for processing the sample transported by the transporting apparatus; a base on which at least one of the sample processing apparatuses is placed; and a movement restricting section for restricting, on the base, a movement area within which the sample processing apparatus moves, wherein the movement restricting section allows the sample processing apparatus to move on the base so as to change orientation of the sample processing apparatus, is disclosed. A base for a sample processing system and a sample processing apparatus are also disclosed.


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