The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2014
Filed:
Jun. 27, 2007
Gerhard Youssefi, Landshut, DE;
Anton Hilger, München, DE;
Julia Hoff, München, DE;
Bausch & Lomb Incorporated, Rochester, NY (US);
Abstract
A method and an apparatus for extrapolating diagnostic data relating to one pupil diameter to another pupil diameter. Embodiments according to the invention are more particularly directed to extrapolating wavefront aberration data, for example, in the form of Zernike polynomial data, obtained from a smaller pupil diameter, d, to a larger pupil diameter, d. Data relating to the first pupil diameter dmay be obtained in a diagnostic procedure. In the extrapolation, a conversion matrix M is utilized. The conversion matrix M can be generated from a static matrix and a dynamic matrix, the latter taking the pupil diameter dinto consideration. Data relating the first pupil diameter dand wavefront aberration data can be ordered via a permutation matrix P. If necessary, Extrapolated data can be re-ordered via a transposed permutation matrix P. The extrapolated data relating to the pupil diameter dcan be processed to obtain an ablation profile, a shot file, or other data for a refractive vision correction treatment.