The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2014
Filed:
Oct. 21, 2010
William D. Andruss, Minneapolis, MN (US);
Christopher H. Claudatos, San Jose, CA (US);
Bruce D. Leetch, Mason, OH (US);
Steven R. Terwilliger, Foster City, CA (US);
William D. Andruss, Minneapolis, MN (US);
Christopher H. Claudatos, San Jose, CA (US);
Bruce D. Leetch, Mason, OH (US);
Steven R. Terwilliger, Foster City, CA (US);
EMC Corporation, Hopkinton, MA (US);
Abstract
Differential scanning is disclosed. A scan collection period is determined. A system is monitored to detect object events during the scan collection period, and a scan list may be updated with information regarding objects to be scanned, based on some of the object events. Objects are scanned based on the information in the scan list. Information regarding objects associated with object events occurring outside the scan collection period may be removed from the scan list.