The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2014

Filed:

Aug. 31, 2006
Applicants:

David A. Brown, Austin, TX (US);

James Thomas Kirk, Austin, TX (US);

David P. Sonnier, Austin, TX (US);

Chris R. Stone, Austin, TX (US);

Inventors:

David A. Brown, Austin, TX (US);

James Thomas Kirk, Austin, TX (US);

David P. Sonnier, Austin, TX (US);

Chris R. Stone, Austin, TX (US);

Assignee:

Agere Systems LLC, Allentown, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a system including a processor and memory coupled to the processor, a method of device failure analysis includes the steps of: upon each error detected within a test series performed on a device, the processor storing within a table in the memory an address at which the error occurred in the device and storing a bit position of each failed bit corresponding to that address; for each unique address at which at least one error occurred, determining how many different bit positions corresponding to the address failed during the test series; and based on results of the test series, determining whether the device failed the test series.


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