The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2014
Filed:
Aug. 19, 2011
Christoph Lingenfelder, Herrenberg, DE;
Pascal Pompey, Nanterre, FR;
Michael Wurst, Stuttgart, DE;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A predictive analysis generates a predictive model (Padj(Y|X)) based on two separate pieces of information, The predictive analysis begins by generating a base model distribution (Pgen(Y|X)) from the original training data set (Dorig) containing tuples (x,y) of indicators (x) and corresponding labels (y). Using the 'true' distribution (Ptrue(X)) of indicators, a random data set (D') of indicator records (x) is generated reflecting this 'true' distribution (Ptrue(X)). Subsequently, the base model (Pgen(Y|X)) is applied to said random data set (D′), thus assigning a label (y) or a distribution of labels to each indicator record (x) in said random data set (D′) and generating an adjusted training set (Dadj). Finally, an adjusted predictive model (Padj(Y|X)) is trained based on said adjusted training set (Dadj).