The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2014
Filed:
Jun. 23, 2011
Curtis Alan Parvin, McKinney, TX (US);
John C. Yundt-pacheco, Fairview, TX (US);
Curtis Alan Parvin, McKinney, TX (US);
John C. Yundt-Pacheco, Fairview, TX (US);
Bio-Rad Laboratories, Inc., Hercules, CA (US);
Abstract
The present invention proposes a method for optimizing a quality control strategy for rapid release results. An embodiment of the invention includes generating a set of candidate quality control rules and for each candidate rule, computing a maximum number of patient specimens that can be tested between quality control events while keeping the expected number of correctable unacceptable results below a predetermined correctable maximum and keeping the expected number of final unacceptable results below a predetermined final maximum. Furthermore a quality control utilization rate can be computed based on the number of patient specimens tested between each quality control event and the number of reference samples tested at each quality control event. The candidate rule for which the best quality control utilization rate may be selected along with the corresponding number of patients to be tested between each quality control as the optimum quality control strategy.