The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2014
Filed:
Oct. 05, 2009
Daniel Richard, Quebec City, CA;
Dirk Verspeelt, Gentbrugge, BE;
Frederic Morrow, Quebec City, CA;
Guy Maes, Quebec City, CA;
Jean-francois Tremblay, Quebec City, CA;
Martin Garneau, Quebec City, CA;
Stephane Turgeon, St-Nicolas, CA;
Alexandre Charlebois, Quebec City, CA;
Daniel Richard, Quebec City, CA;
Dirk Verspeelt, Gentbrugge, BE;
Frederic Morrow, Quebec City, CA;
Guy Maes, Quebec City, CA;
Jean-Francois Tremblay, Quebec City, CA;
Martin Garneau, Quebec City, CA;
Stephane Turgeon, St-Nicolas, CA;
Alexandre Charlebois, Quebec City, CA;
Zetec, Inc., Snoqualmie, WA (US);
Abstract
A method of establishing position dependent focal laws and dynamically accessing these focal laws during inspection is disclosed comprising the steps of partitioning a CAD model into distinct geometric regions prior to inspection, generating a dedicated set of focal laws for each of the geometric regions, and associating each position of the scanner with one of the geometric regions. A method of compressing an A-Scan using a windowing technique is also disclosed. Additionally, methods for computing and displaying volumetric slices in real-time are disclosed. Finally, a method of firing multiple probes at different firing frequencies is disclosed, as well as a multi-probe inspection system that enables parallel firing.