The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2014

Filed:

Jul. 06, 2009
Applicants:

Yunje OH, Medina, MN (US);

Matthew R. Wilson, Madison, WI (US);

Ryan Charles Major, Crystal, MN (US);

Syed Amanula Syed Asif, Bloomington, MN (US);

Oden L. Warren, New Brighton, MN (US);

Inventors:

Yunje Oh, Medina, MN (US);

Matthew R. Wilson, Madison, WI (US);

Ryan Charles Major, Crystal, MN (US);

Syed Amanula Syed Asif, Bloomington, MN (US);

Oden L. Warren, New Brighton, MN (US);

Assignee:

Hysitron Incorporated, Minneapolis, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
Abstract

A method of damping control for a nanomechanical test system, the method including providing an input signal, providing an output signal representative of movement of a displaceable probe along an axis in response to the input signal, performing a frequency-dependent phase shift of the output signal to provide a phase-shifted signal, adjusting the phase-shifted signal by a gain value to provide a feedback signal, and adjusting the input signal by incorporating the feedback signal with the input signal.


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