The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2014

Filed:

Dec. 31, 2012
Applicant:

Rjs Technologies, Inc., Minneapolis, MN (US);

Inventor:

Christopher Ian French, Plymounth, MN (US);

Assignee:

RJS Technologies, Inc., Minneapolis, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/024 (2006.01); H04N 1/04 (2006.01); G06K 15/10 (2006.01); G06K 7/10 (2006.01); G06K 7/14 (2006.01); G06K 9/22 (2006.01); G06K 9/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image scanning apparatus includes a housing. A first image sensor (linear scan imager) is attached at a first position along the housing. The first image sensor is configured and adapted to scan an image. A second image sensor (area scan imager) is attached at a second position along the housing. The second image sensor is configured and adapted to scan an image to detect movement of the apparatus in the X and Y axis. Movement in the Y axis of the apparatus as detected by the second image sensor is utilized to trigger the first image sensor. Movement in the X axis of the apparatus as detected by the second image sensor is utilized to correct image defects (e.g. skew) of the image captured by the first image sensor thereby allowing the second image sensor to capture a 2D inspection area.


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